CSUSBD

csusbd
  • Support for High Speed (480 Mbit/s) and Full Speed (12 Mbit/s) devices
  • Compliant with USB 2.0 specification
  • Easy-to-use API
  • Extensive test cases and test harness to verify stack integration
  • Support for composite (multifunction) devices
  • Support for multiple USB device configurations
  • Power saving functionalities such as device suspend and resume
  • Support for Audio, CDC-ACM, CDC-EEM, HID, MSC, PHDC, and Vendor classes
  • Support from Microsoft OS Descriptors for USB devices (which simplifies installation of vendor-specific drivers on Windows OS)
ClassExample USB Devices
Audio
(Available for devices using the Synopsys_OTG_HS driver)
Support audio devices such as speakers, microphones, headset, etc.
Extended audio functions (such as adaptive audio correction) and controls (volume, mute, treble, bass, etc.)
Communications Device Class Abstract Control Model (CDC-ACM)Emulation of a virtual serial port on the host PC
The host PC can communicate with the device using a serial terminal or native serial communication APIs
Communications Device Class Ethernet Emulation Model (CDC-EEM)Ethernet networking over USB
The Cs/NET stack is used for network communication and any of its applications can be used
Human Interface Device Class (HID)Support for devices such as mice and keyboards
Mass Storage Class (MSC)Support for storage media from the host PC
Offers advanced features such as interoperability with Cs/FS file system module
Personal Healthcare Device Class (PHDC)
(Available for devices using Cs/OS2)
Allows to build USB devices that are meant to be used to monitor and improve personal healthcare
USB Device Class Definition for Personal Healthcare Devices
Vendor ClassThe vendor class allows you to create any device that cannot fall into a standard class for which a standard has been set by the USB implementers forum. It allows you to perform raw bulk and interrupt communications with the host. Cs/USBD offers a framework to help create host applications (Windows OS only) that communicate with these devices
DriverExamples of Platform
AT32UC3CAtmel AVR UC3 C-Series (AT32UC3C)
AT32UC3xAtmel AVR UC3 A0-Series (AT32UC3A0x)
Atmel AVR UC3 A1-Series (AT32UC3A1x)
Atmel AVR UC3 B-Series (AT32UC3B)
AT91SAM_UDPHSAtmel SAM3U
Atmel SAM9R (e.g. SAM9RL64)
Atmel SAM9M (e.g. SAM9M10)
Atmel SAM9G (e.g. SAM9G45)
Kinetis_KxxNXP Kinetis K series
LPCxxxxNXP LPC17xx (e.g. LPC1768)
NXP LPC214x (e.g. LPC2148)
NXP LPC23xx (e.g. LPC2378)
NXP LPC24xx (e.g. LPC2468, LPC2478)
NXP LPC29xx
NXP LPC318x
Synopsys_OTG_HSNXP LPC313x (e.g. LPC3131)
NXP LPC185x (e.g. LPC1857)
NXP LPC183x
NXP LPC182x
NXP LPC435x (e.g. LPC4350)
NXP LPC433x
NXP LPC432x
Xilinx Zynq
NXP i.MX
NXP Kinetis K70
Renesas_USBHSRenesas RZ/A series (RZ/A1)
Renesas RX64M
RX600Renesas RX600 series (RX62N, RX63N, RX630)
Renesas RX100 series (RX111)
Renesas V850E2/Jx4-L series
STM32F_FSST STM32 F1 series (e.g. STM32F105, ST STM32F107)
ST STM32 F2 series (e.g. STM32F207, ST STM32F217)
ST STM32 F4 series (e.g. STM32F407, ST STM32F417)
ST STM32 U5575x/585x devices
DWC_OTG_HSST STM32 F2 series (High Speed)
ST STM32 F4 series (High Speed)
ST STM32 F7 series (High Speed)
ST STM32 H7 series (High Speed)
ST STM32 N6 series (High Speed)
STM32xxxST STM32F103xx (e.g. STM32F103ZE)
ST STM32F102xx
ST STM32L1xx (e.g. STM32L152)
STR91xxxST STR9
RM48xTexas Instruments RM48 series
TM4C123xTexas Instruments Stellaris LM4F series
Texas Instruments Tiva C-series

USB Command Verifier (USBCV) is used to validate the compliance of the stack with the USB Specification. USBCV is the official compliance test tool that evaluates High, Full, and Low-speed USB devices for conformance. This tool is provided by the USB Implementers Forum (USB-IF).

USBCV offers a test suite to validate the compliance of a device with Chapter 9 of the USB specification Revision 2.0 (enumeration process). It also offers a test suite for several classes.

LayerUSBCV Test Suite
CoreChapter 9 tests
Human Interface Device classHID tests
Mass Storage ClassMSC tests
Device Controller DriverChapter 9, HID, MSC, and PHDC tests

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