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 2250 Temperature Test System




  • Automated, software based quartz crystal temperature test system

  • Measures crystal parameters over easily defined temperature profile
  • Parameter and curve fit characteristics are checked against easy to define QC limits

  • Crystals of different frequencies can be tested in a single temperature run
  • Measurement data available in spread sheet, ASCII and binary formats
  • Crystal part number defines complete measurement parameters, QC limits, temperature test points and data printouts



  • Standard dual row test wheel with extended life test head contacts holds 254 devices
  • Easily loaded S&A proprietary sockets accepts HC45, HC49, HC43, HC49US, HC18, SMD and tubular type packages
  • IEC-444 Pi Network test head with extended life contacts and switch selected variable capacitor for load frequency measurements




Frequency Range: 1 MHz - 200 MHz
Frequency Correlation: +/- 2 ppm at series, typical *
Crystal Power: 0.01 uW - 1000 uW into 25 ohms
Temperature Stability: +/- 0.1 Degree C


*Proprietary measurement and calibration algorithms provide correlation to industry standard crystal measurement equipment.




Series Resonant Frequency Motional Capacitance Power Level
Load Resonant Frequency Motional Inductance Capacity Ratio
Load Capacitance Resistance Drive Level Dependency
Shunt Capacitance Quality Factor Spurious Testing
Trim Sensitivity Others




Series Resonant Frequency Load Resonant Frequency Resistance 




S&A 250A Transmission Test System Computer
S&A 4220 Temperature Test Chamber System Software
            (CO2 LN2 or MR option) Printer (Optional)
IEC-444 Pi-Network Test Head (dual row)




  • Data and Curve Fit Tabulations
  • Data and Curve Fit Plots
  • List of QC Failures Only
  • Other formats available including crystal grouping, customer created printouts and custom.


   6300126-05  Copyright 1999 Saunders & Associates, Inc. 

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